X-ray diffraction at constant penetration depth : a viable approach for characterizing steep residual stress gradients

Beck, Tilmann; Erbacher, Thomas; Wanner, Alexander; Vöhringer, Otmar

Oxford : Blackwell (2008)
Journal Article

In: Journal of applied crystallography : JAC
Volume: 41
Issue: 2
Page(s)/Article-Nr.: 377-385